Frank Demmerle

Multi-site test of RF transceivers on low-cost digital ATE

Frank Neugebauer, Dirk Rautmann, Ivo Koren, 2011, 2011 IEEE International Test Conference.

Integrated RF-CMOS Transceivers challenge RF Test

Frank Demmerle, 2006, 2006 IEEE International Test Conference.

Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores

Carsten Wegener, Frank Demmerle, Heinz Mattes, 2009, J. Electron. Test..

FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests

Roland May, Ivo Koren, Frank Demmerle, 2007, 12th IEEE European Test Symposium (ETS'07).

Production test challenges for highly integrated mobile phone SOCs — A case study

Frank Poehl, Juergen Alt, Frank Demmerle, 2010, 2010 15th IEEE European Test Symposium.