Abdullah Khan

Stacking Classifier with Random Forest functioning as a Meta Classifier for Diabetes Diseases Classification

D. A. Ramli, Saima Anwar Lashari, Wareesa Sharif, 2022, Procedia Computer Science.

Silicon Wafer Map Defect Classification Using Deep Convolutional Neural Network With Data Augmentation

Ashadullah Shawon, Md Omar Faruk, Masrur Bin Habib, 2019, 2019 IEEE 5th International Conference on Computer and Communications (ICCC).