E. Sundholm

Passivation of Amorphous Oxide Semiconductors Utilizing a Zinc–Tin–Silicon–Oxide Barrier Layer

D. Keszler, J. Wager, R. Hoffman, 2012, IEEE Electron Device Letters.

Mapping out the distribution of electronic states in the mobility gap of amorphous zinc tin oxide

David Hong, Rick E. Presley, John F. Wager, 2009 .

AC/DC Rectification With Indium Gallium Oxide Thin-Film Transistors

J. Wager, R. Presley, B. McFarlane, 2010, IEEE Electron Device Letters.