D. M. Shirokov

Application of PIXE and RBS methods in the analysis of thin films of high-Tc superconductors

A. Kobzev, V. Kliment, R. Šandrik, 1993 .

Changes in depth profiles of oxygen and copper in Y-Ba-Cu-O film under annealing

A. Kobzev, D. M. Shirokov, Leonid P. Chernenko, 1994 .

New computer iterative fitting program DVBS for backscattering analysis

V. Boháč, D. M. Shirokov, 1994 .

Backscattering method possibilities for precise determination of the oxygen profile in oxide films by the use of the elastic resonance in reaction 16O(4He, 4He)16O at 3.045 MeV of 4He

A. Kobzev, L. Chernenko, D. M. Shirokov, 1992 .