Pierrick T. Bourgeat

Comparison of texture features for segmentation of patterned wafers

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2004, SPIE Optics East.

Content-based segmentation of patterned wafer for automatic threshold determination

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2003, IS&T/SPIE Electronic Imaging.

Patterned wafer segmentation

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2003, International Conference on Quality Control by Artificial Vision.

Segmentation d'images de semiconducteur pour la détection de défauts

Kenneth W. Tobin, Fabrice Meriaudeau, Patrick Gorria, 2003 .