R. Ladbury

A Bayesian Approach for Total Ionizing Dose Hardness Assurance

R. Ladbury, B. Triggs, 2011, IEEE Transactions on Nuclear Science.

Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node

R. Ladbury, R.A. Reed, M.D. Berg, 2006, 2006 IEEE Radiation Effects Data Workshop.

Statistical Modeling for Radiation Hardness Assurance: Toward Bigger Data

R. Ladbury, M. J. Campola, R. Ladbury, 2015, IEEE Transactions on Nuclear Science.

Statistical methods for large flight lots and ultra-high reliability applications

R. Ladbury, J.L. Gorelick, 2005, IEEE Transactions on Nuclear Science.

Statistical Model Selection for TID Hardness Assurance

R. Ladbury, S.S. McClure, J.L. Gorelick, 2009, IEEE Transactions on Nuclear Science.

Radiation Performance of 1 Gbit DDR2 SDRAMs Fabricated with 80-90 nm CMOS

R. Ladbury, M.D. Berg, M. Friendlich, 2008, 2008 IEEE Radiation Effects Data Workshop.