S. Naudet

An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization

Rajesh Kumar Immadi, P. Girard, A. Virazel, 2016, Journal of Electronic Testing.

Cognitive approach to support dynamic aging compensation

David Meyer, Sylvie Naudet, Vincent Huard, 2017, 2017 IEEE International Test Conference (ITC).

Mission profile recorder: An aging monitor for hard events

A. Jain, V. Huard, F. Cacho, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology

Robin Wilson, Arnaud Virazel, Alberto Bosio, 2015, Sixteenth International Symposium on Quality Electronic Design.