Kexin Yang

CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration

Rui Zhang, L. Milor, Taizhi Liu, 2022, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory

Taizhi Liu, Linda Milor, Kexin Yang, 2021, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Modeling of FinFET SRAM array reliability degradation due to electromigration

Rui Zhang, L. Milor, Taizhi Liu, 2019, Microelectronics Reliability.

A detailed investigation of low latitude tweek atmospherics observed by the WHU ELF/VLF receiver: I. Automatic detection and analysis method

B. Ni, Juan Yi, X. Gu, 2020 .

Deep learning based mobile data offloading in mobile edge computing systems

Hao Jiang, Xianlong Zhao, Duo Peng, 2019, Future Gener. Comput. Syst..

Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations

Taizhi Liu, Linda Milor, Rui Zhang, 2017, Microelectron. Reliab..

Joint Beamforming Coordination and User Selection for CoMP-Enabled NR-U Networks

Meikang Qiu, Kexin Yang, Hao Jiang, 2021, IEEE Internet of Things Journal.

Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown

Taizhi Liu, Linda Milor, Kexin Yang, 2017, 2017 IEEE International Integrated Reliability Workshop (IIRW).