C. Chan

发表

Junctionless Poly-GeSn Ferroelectric TFTs with Improved Reliability by Interface Engineering for Neuromorphic Computing.

C. Chou, Yung-Hsien Wu, Yu-Kai Huang, 2019, ACS applied materials & interfaces.

Enabling large memory window and high reliability for FeFET memory by integrating AlON interfacial layer

Yung-Hsien Wu, Kuen-Yi Chen, Hao-Kai Peng, 2021 .

FeFET Memory Featuring Large Memory Window and Robust Endurance of Long-Pulse Cycling by Interface Engineerlng Using High-k AlON

Yung-Hsien Wu, Kuen-Yi Chen, Hao-Kai Peng, 2020, 2020 IEEE Symposium on VLSI Technology.

Impact of GeSn Crystallinity on Reliability of Ferroelectric HfZrOx for Devices with Metal–Ferroelectric–Semiconductor Structure

C. Chou, Yung-Hsien Wu, Yu-Kai Huang, 2020, physica status solidi (RRL) – Rapid Research Letters.