S. Mitra

Macro-Model for Post-Breakdown 90NM and 130NM Transistors and its Applications in Predicting Chip-Level Function Failure after ESD-CDM Events

R.W. Dutton, Wei Wang, Tze Wee Chen, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

FPGA based field deployable instrumentation system for neutron time of flight sub nanosecond coincidence spectroscopy

S.S. Junnarkar, R. Fontaine, S. Mitra, 2007, 2007 IEEE Nuclear Science Symposium Conference Record.