Seung-Gyu Oh

A novel cell charge evaluation scheme and test method for 4 Mb nonvolatile ferroelectric RAM

Kinam Kim, K. Suh, B. Jeon, 1999, ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361).

An embedded nonvolatile FRAM with electrical fuse repair scheme and one time programming scheme for high performance smart cards

Kang-Woon Lee, Han-Ju Lee, So-Ra Kim, 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..