A. Takano

发表

Oxygen-ion-induced ripple formation on silicon: evidence for phase separation and tentative model

Y. Homma, Y. Higashi, A. Takano, 2003 .

Silicon isotope superlattices: Ideal SIMS standards for shallow junction characterization

K. Itoh, Y. Shimizu, A. Takano, 2008 .

Film thickness determining method of the silicon isotope superlattices by SIMS

K. Itoh, Y. Shimizu, A. Takano, 2008 .

Evaluation of SIMS depth resolution using delta-doped multilayers and mixing–roughness-information depth model

H. Takenaka, Y. Homma, M. Inoue, 2003 .

SIMS study of depth profiles of delta-doped boron/silicon alternating layers by low-energy ion beams

H. Takenaka, Y. Homma, S. Hayashi, 2003 .

Round‐robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling

D. Simons, C. Magee, K. Kim, 2017 .

Development of a Certified Reference Material with Delta-Doped Boron Nitride Layers for Surface Depth-Profile Analysis

A. Kurokawa, S. Terauchi, Y. Azuma, 2016 .

Evaluation of sputtering rate change in the silicon transient region under medium energy O2+ sputtering

H. Takenaka, A. Takano, 2008 .

Evaluation of the sputtering rate variation in SIMS ultra‐shallow depth profiling using multiple short‐period delta layers

H. Takenaka, Y. Homma, F. Toujou, 2003 .

AFM Tip Characterizer fabricated by Si/SiO2 multilayers

H. Takenaka, T. Ohchi, H. Itoh, 2011 .

Behaviors of neutral and charged silicon self-interstitials during transient enhanced diffusion in silicon investigated by isotope superlattices

Y. Shiraki, K. Itoh, K. Sawano, 2009 .

Observation of ripple formation on O2+-irradiated GaN surfaces using atomic force microscopy

Y. Homma, Y. Higashi, A. Takano, 2003 .

Quantitative Evaluation of Silicon Displacement Induced by Arsenic Implantation Using Silicon Isotope Superlattices

Y. Shiraki, K. Itoh, K. Sawano, 2008 .

Simultaneous observation of the behavior of impurities and silicon atoms in silicon isotope superlattices

K. Itoh, Y. Shimizu, M. Uematsu, 2007 .

Evaluation of Time-of-Flight Secondary Ion Mass Spectrometry Spectra of Peptides by Random Forest with Amino Acid Labels: Results from a Versailles Project on Advanced Materials and Standards Interlaboratory Study.

H. Jungnickel, A. Luch, B. Hagenhoff, 2021, Analytical chemistry.

Final report on VAMAS round‐robin study to evaluate a correction method for saturation effects in DSIMS

D. Simons, C. Magee, J. Bennett, 2015 .

VAMAS round‐robin study to evaluate a correction method for saturation effects in D‐SIMS

D. Simons, C. Magee, J. Bennett, 2014 .

Comparison of a new dead‐time correction method and conventional models for SIMS analysis

S. Ichimaru, H. Takenaka, H. Nonaka, 2012 .