J.Y. Wu

A method to maintain phase-change memory pre-coding data retention after high temperature solder bonding process in embedded systems

M. Breitwisch, S. Raoux, Y. Shih, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

A 40nm Low-Power Logic Compatible Phase Change Memory Technology

Carlos H. Diaz, Y. Chih, Carlos H. Díaz, 2018, 2018 IEEE International Electron Devices Meeting (IEDM).

Mechanisms of retention loss in Ge2Sb2Te5-based Phase-Change Memory

B. Rajendran, R. Dasaka, Y. Zhu, 2008, 2008 IEEE International Electron Devices Meeting.