M. Calabrese

Sensitive Volume and Extreme Shifts in Floating Gate Cells Irradiated with Heavy Ions

A. Paccagnella, A. Visconti, V. Ferlet-Cavrois, 2015, IEEE Transactions on Nuclear Science.

Upsets in Erased Floating Gate Cells With High-Energy Protons

A. Paccagnella, A. Visconti, J. Schwank, 2017, IEEE Transactions on Nuclear Science.

Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology

Andrea L. Lacaita, Sebastiano Bartolone, S. Beltrami, 2013, Proceedings of 2013 International Conference on IC Design & Technology (ICICDT).