M. Scheele

Angular x-ray cross-correlation analysis (AXCCA):

F. Schreiber, I. Zaluzhnyy, R. Kurta, 2019 .

Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

P. Chrétien, F. Houzé, O. Schneegans, 2009 .

Energy transfer in argon atom – Surface interactions studied by Pt–SiO2–Si thin film chemoelectronic devices

D. Diesing, E. Hasselbrink, I. Nedrygailov, 2015 .

Anisotropy of Electroreflectance Due to Orbital Degeneracy of Energy Bands

R. Enderlein, P. Renner, M. Scheele, 1975 .