Kee-sup Kim
发表
Dirk Timmermann,
Bernd Becker,
Yiannos Manoli,
2001
.
Ming Zhang,
Subhasish Mitra,
Kee Sup Kim,
2006,
2006 IEEE International Test Conference.
Naresh R. Shanbhag,
Ming Zhang,
Quan Shi,
2006,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
N. Seifert,
S. Mitra,
M. Zhang,
2005,
Computer.
Bernd Becker,
Matthias Sauer,
Subhasish Mitra,
2013,
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference.
Bernd Becker,
Matthias Sauer,
Subhasish Mitra,
2013,
2013 IEEE International Test Conference (ITC).
T.M. Mak,
Ming Zhang,
N. Seifert,
2007,
2007 IEEE International Conference on Integrated Circuit Design and Technology.
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2006,
2006 IFIP International Conference on Very Large Scale Integration.
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2005,
IEEE International Conference on Test, 2005..
Subhasish Mitra,
David J. Leavins,
Kee Sup Kim,
2005,
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..
Madhavan Swaminathan,
Woong Hwan Ryu,
Sung Joo Park,
2013,
2013 IEEE 22nd Conference on Electrical Performance of Electronic Packaging and Systems.
Subhasish Mitra,
Kee Sup Kim,
S. Mitra,
2006,
IEEE Transactions on Computers.
Subhasish Mitra,
Kee Sup Kim,
S. Mitra,
2004,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Subhasish Mitra,
Kee Sup Kim,
S. Mitra,
2003,
Proceedings 21st International Conference on Computer Design.
Subhasish Mitra,
Kee Sup Kim,
S. Mitra,
2002,
Proceedings. International Test Conference.
Ming Zhang,
James Tschanz,
T. M. Mak,
2007,
13th IEEE International On-Line Testing Symposium (IOLTS 2007).
Subhasish Mitra,
Kee Sup Kim,
Paul G Ryan,
2003,
IEEE Design & Test of Computers.