F. Almeida

Quantitative calibration of intense (α, α) elastic scattering resonances for 12C at 5.50–5.80 MeV and for 16O at 7.30–7.65 MeV

J. Davies, J. Forster, R. Siegele, 1994 .

Absolute calibration of the 16O(α,α)16O elastic scattering resonance at 7.30–7.65 MeV and applications to oxygen depth profiling

J. Davies, T. Jackman, F. Almeida, 1993 .

Fabrication of nanostructures in strained InGaAs/GaAs quantum wells by focused-ion-beam implantation

M. Buchanan, G. C. Aers, S. Charbonneau, 1992 .