J. P. Keradec

Representing electrical behaviour of transformers by lumped element circuits: a global physical approach

A. Schellmanns, J. P. Keradec, Jean-Luc Schanen, 1999, Conference Record of the 1999 IEEE Industry Applications Conference. Thirty-Forth IAS Annual Meeting (Cat. No.99CH36370).

Experimental characterization of a non linear electrostatic quadripole: application to insulated gate power components

J. P. Keradec, Yves Lembeye, J. L. Schanen, 1998, IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222).

Incidence of the resolution and the differential nonlinearity of a A/D converter on high dynamic signal measurement experimental characterization

J. P. Keradec, G. Cauffet, 1992, [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference.

Measurement bench for near field characterisation of wound components

A. Schellmanns, J. P. Keradec, Jean-Luc Schanen, 1999, IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309).

Electrical equivalent circuit for frequency dependant impedance: minimum lumped elements for a given precision [SMPS transformer]

A. Schellmanns, J. P. Keradec, J. L. Schanen, 2000, Conference Record of the 2000 IEEE Industry Applications Conference. Thirty-Fifth IAS Annual Meeting and World Conference on Industrial Applications of Electrical Energy (Cat. No.00CH37129).

Accounting for resistivity and permittivity in high frequency permeability measurements: application to MnZn ferrites

J. P. Keradec, F. Blache, B. Cogitore, 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

INFLUENCE OF INDUCED CURRENTS IN CONDUCTORS ON LEAKAGE AND LOSSES IN A TRANSFORMER

J. P. Keradec, Gérard Meunier, E. Laveuve, 1991 .

Nano-teslameter for characterization of the fields emitted and received by wound electronic components.

J. P. Keradec, Jean-Luc Schanen, T. Creuzet, 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

Equivalent circuits for transformers based on one-dimensional propagation: accounting for multilayer structure of windings and ferrite losses

A. Schellmanns, J. P. Keradec, Jean-Luc Schanen, 2000 .

1D-propagation based equivalent circuits for transformers: accounting for multi-layer structure of windings and ferrite losses

A. Schellmanns, J. P. Keradec, Jean-Luc Schanen, 1997, IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting.

Experimental characterization of insulated gate power components: capacitive aspects

J. P. Keradec, Yves Lembeye, J. L. Schanen, 1997, IAS '97. Conference Record of the 1997 IEEE Industry Applications Conference Thirty-Second IAS Annual Meeting.

Improvement in the linearity of fast digital oscilloscopes used in averaging mode

J. P. Keradec, Y. Lembeye, G. Cauffet, 1993 .