M. C. Maya

发表

A method for the determination of a distributed FET noise model based on matched‐source noise‐figure measurements

Antonio Lazaro, Lluis Pradell, M. C. Maya, 2004 .

Experimental and numerical characterization of microwave structures at cryogenic temperatures

J. L. Medina, M. C. Maya, R. A. Chávez Pérez, 2006 .

Extraction of an avalanche diode noise model for its application as an on‐wafer noise source

Antonio Lazaro, Lluis Pradell, M. C. Maya, 2003 .

A method for characterizing coplanar waveguide‐to‐microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobes

Antonio Lazaro, Lluis Pradell, M. C. Maya, 2003 .

MEASUREMENT OF ON-WAFER TRANSISTOR NOISE PARAMETERS WITHOUT A TUNER USING UNRESTRICTED NOISE SOURCES

Antonio Lazaro, Lluis Pradell, M. C. Maya, 2002 .

Determination of FET noise parameters from 50 Ω noise figure measurements using a distributed noise model

Antonio Lazaro, Lluis Pradell, M. C. Maya, 2002 .

A method to simultaneously extract the small‐signal equivalent circuit and noise parameters of heterojunction bipolar transistors

M. C. Maya, A. Lázaro, L. Pradell, 2006 .

Bias‐dependence of FET intrinsic noise sources, determined with a quasi‐2D model

Lluis Pradell, Antonio Lazaro, M. C. Maya, 2003 .

Noise model of a reverse‐biased cold‐FET applied to the characterization of its ENR

M. C. Maya, A. Lázaro, L. Pradell, 2004 .

Cold-FET ENR Characterisation Applied to the Measurement of On-Wafer Transistor Noise Parameters

M. C. Maya, A. Lázaro, L. Pradell, 2002, 2002 32nd European Microwave Conference.