Hao Hu

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Hao Hu, Lin Zhao, S. H. Goh, 2019, Microelectronics Reliability.

Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks

Hao Hu, Lin Zhao, Jeffrey Lam, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).