S. Malik

Quantified contribution of design for manufacturing to yield at 28nm

Sriram Madhavan, Shobhit Malik, Thomas Herrmann, 2014, 2014 19th IEEE European Test Symposium (ETS).

Deriving Feature Fail Rate from Silicon Volume Diagnostics Data

Thomas Herrmann, Sriram Madhavan, Shobhit Malik, 2013, IEEE Design & Test.