Shanrui Zhang

Modeling yield of carbon-nanotube/silicon-nanowire FET-based nanoarray architecture with h-hot addressing scheme

Minsu Choi, Nohpill Park, Shanrui Zhang, 2004, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..

Probabilistic balancing of fault coverage and test cost in combined built-in self-test/automated test equipment testing environment

Minsu Choi, Fabrizio Lombardi, Nohpill Park, 2004, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..

Cost-driven optimization of fault coverage in combined Built-In Self-Test/Automated Test Equipment testing

Fabrizio Lombardi, Shanrui Zhang, Minsu Choi, 2004, IMTC 2004.

Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing

Minsu Choi, Fabrizio Lombardi, Nohpill Park, 2007, IEEE Transactions on Instrumentation and Measurement.

Probabilistic balancing of fault coverage and test cost in combined built-in self-test/automated test equipment testing environment

Minsu Choi, Fabrizio Lombardi, N. Park, 2004 .

Modeling yield of carbon-nanotube/silicon-nanowire FET-based nanoarray architecture with h-hot addressing scheme

Minsu Choi, N. Park, Shanrui Zhang, 2004 .