G. P. Patsis

Simulation of material and processing effects on photoresist line-edge roughness

G. P. Patsis, M. D. Nijkerk, L.H.A. Leunissen, 2006, Int. J. Comput. Sci. Eng..

Monte Carlo study of surface and line-width roughness of resist film surfaces during dissolution

G. P. Patsis, 2005, Math. Comput. Simul..

Modelling and evaluation of a thermal microfluidic sensor fabricated on plastic substrate

A. Petropoulos, G. Kaltsas, G. P. Patsis, 2012 .