E. Gogolides
发表
G. P. Patsis,
M. D. Nijkerk,
L.H.A. Leunissen,
2006,
Int. J. Comput. Sci. Eng..
Evolution of resist roughness during development: Stochastic simulation and dynamic scaling analysis
V. Constantoudis,
E. Gogolides,
G. P. Patsis,
2010,
2010 27th International Conference on Microelectronics Proceedings.
Angeliki Tserepi,
Konstantinos Misiakos,
S. E. Kakabakos,
2006,
SPIE OPTO.
George P. Patsis,
V. Constantoudis,
E. Gogolides,
2006,
SPIE Advanced Lithography.
V. Constantoudis,
E. Gogolides,
E. Gogolides,
2008,
SPIE Advanced Lithography.
V. Constantoudis,
E. Gogolides,
V.-K. Murugesan Kuppuswamy,
2012,
Advanced Lithography.
S. E. Kakabakos,
E. Gogolides,
A. Tserepi,
2012,
Analytical and Bioanalytical Chemistry.