Frank Scholze
发表
Victor Soltwisch,
Philipp Naujok,
Qais Saadeh,
2019,
Photomask Technology.
Victor Soltwisch,
Sven Burger,
Frank Scholze,
2013,
Optical Metrology.
Frank Schmidt,
Jan Pomplun,
Christian Laubis,
2007,
SPIE Optical Metrology.
Horst Neumann,
D. Feili,
Frank Scholze,
2017
.
Frank Schmidt,
Jan Pomplun,
Christian Laubis,
2007,
SPIE Optical Metrology.
Victor Soltwisch,
Martin Hammerschmidt,
Burkhard Beckhoff,
2019,
Optical Metrology.
Vicky Philipsen,
Eric Hendrickx,
Marc Heyns,
2018
.
Fabrizio Scortecci,
Horst Neumann,
Hans Leiter,
2017
.