P. Rostam-Khani

Total-reflection X-ray fluorescence spectrometry, a powerful tool for semiquantitative analysis of archaeological glass samples

Bernd O. Kolbesen, P. Rostam-Khani, H Urban, 1997 .

Trace element determination in drugs by total-reflection X-ray fluorescence spectrometry 1 This pape

B. Kolbesen, C. Rittmeyer, A. Wittershagen, 1997 .

Determination of metal-cofactors in enzyme complexes by total-reflection X-ray fluorescence spectrometry

R. Gross, V. Zickermann, B. Ludwig, 1997 .

Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface

B. Kolbesen, N. Alov, C. Rittmeyer, 2001 .

Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS

P. Rostam-Khani, J. Philipsen, E. Jansen, 2006 .

Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF

G. Noij, M. Hopstaken, P. Rostam-Khani, 2004 .