Naim Ben-Hamida

发表

Analog circuit testing based on sensitivity computation and new circuit modeling

Bozena Kaminska, Naim Ben-Hamida, B. Kaminska, 1993, Proceedings of IEEE International Test Conference - (ITC).

Pseudo-random vector compaction for sequential testability

Yvon Savaria, Bozena Kaminska, Naim Ben-Hamida, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.

Epilepsy seizure prediction using graph theory

Larbi Talbi, Ahmed Lakhssassi, Tahar Haddad, 2014, 2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS).

Analysis and Modeling of the Phase Detector Hysteresis in Bang-Bang PLLs

Calvin Plett, Sadok Aouini, Naim Ben-Hamida, 2015, IEEE Transactions on Circuits and Systems I: Regular Papers.

Partial Pre-Emphasis for Pluggable 400 G Short-Reach Coherent Systems

Xueyang Li, Ahmad Abdo, Claude D’Amours, 2019, Future Internet.

Multiple fault analog circuit testing by sensitivity analysis

Bozena Kaminska, Naim Ben-Hamida, 1993, J. Electron. Test..

A perturbation based fault modeling and simulation for mixed-signal circuits

Bozena Kaminska, David Marche, Khaled Saab, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Initiability: A Measure Of Sequential Testability

Yvon Savaria, Bozena Kaminska, Naim Ben-Hamida, 1993, 1993 IEEE International Symposium on Circuits and Systems.

High level synthesis with testability constraints

Bozena Kaminska, Naim Ben-Hamida, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.

FaultMaxx: A Perturbation Based Fault Modeling and Simulation for Mixed-Signal Circuits

Bozena Kaminska, Khaled Saab, Naim Ben-Hamida, 2001 .

Automatic test vector generation for mixed-signal circuits

Bozena Kaminska, Naim Ben-Hamida, Bechir Ayari, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

Parametric fault simulation and test vector generation

Bozena Kaminska, Khaled Saab, Naim Ben-Hamida, 2000, DATE '00.

A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution

Jean-Francois Bousquet, Sadok Aouini, Naim Ben-Hamida, 2013, Proceedings of the IEEE 2013 Custom Integrated Circuits Conference.

A 56GS/S 6b DAC in 65nm CMOS with 256×6b memory

Marinette Besson, Peter Schvan, Jorge Aguirre, 2011, 2011 IEEE International Solid-State Circuits Conference.

Closing the gap between analog and digital

Bozena Kaminska, Khaled Saab, Naim Ben-Hamida, 2000, Proceedings 37th Design Automation Conference.

A 24GS/s 6b ADC in 90nm CMOS

Yuriy Greshishchev, Peter Schvan, John Sitch, 2008, 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.

Adaptive Coherent Receiver Settings for Optimum Channel Spacing in Gridless Optical Networks

Ahmad Abdo, Claude D'Amours, Sadok Aouini, 2019, Future Internet.

Closing the gap between analog and digital testing

Bozena Kaminska, Khaled Saab, Naim Ben-Hamida, 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Testing of embedded A/D converters in mixed-signal circuit

Bozena Kaminska, Naim Ben-Hamida, Bechir Ayari, 1996, Proceedings International Conference on Computer Design. VLSI in Computers and Processors.

Spur reduction in bang-bang PLLs using programmable bit-stream

Calvin Plett, Sadok Aouini, Naim Ben-Hamida, 2011 .

LIMSoft: automated tool for design and test integration of analog circuits

Bozena Kaminska, David Marche, Khaled Saab, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

A 40GS/s 6b ADC in 65nm CMOS

Marinette Besson, Peter Schvan, Jorge Aguirre, 2010, 2010 IEEE International Solid-State Circuits Conference - (ISSCC).

Multiple fault testing in analog circuits

Bozena Kaminska, Naim Ben-Hamida, 1994, Proceedings of 7th International Conference on VLSI Design.

A 32-nm CMOS Frequency Locked Loop for 20-GHz Synthesis with ± 7.6 ppm Resolution

Jean-Francois Bousquet, Sadok Aouini, Naim Ben-Hamida, 2013, 2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).

Temporal epilepsy seizures monitoring and prediction using cross-correlation and chaos theory.

Ahmed Lakhssassi, Sadok Aouini, Naim Ben-Hamida, 2014, Healthcare technology letters.

Frequency response of dual-drive silicon photonic modulators with coupling between electrodes.

David V Plant, Mahdi Parvizi, Naim Ben-Hamida, 2018, Optics express.