Baoliang Bob Wang

Industrial applications of a high-sensitivity linear birefringence measurement system

Baoliang Bob Wang, Theodore C. Oakberg, Paul Kadlec, 1999, Optics + Photonics.

Further evaluation of the Exicor birefringence measurement system

Baoliang Bob Wang, 2000, SPIE Optics + Photonics.

Residual birefringence in photomask substrates

Baoliang Bob Wang, 2002 .

Linear birefringence measurement instrument using two photoelastic modulators

Baoliang Bob Wang, Baoliang Wang, 2002 .