A. Žabkar

发表

Structural analysis of ZrN and TiN films prepared by reactive plasma beam deposition

J. Fiser, P. Panjan, B. Navinšek, 1993 .

Preparation and characterization of multilayer metallization structures with titanium nitride and titanium silicide

Z. Krivokapic, M. Koželj, M. Godec, 1989 .

TiSi2 formation during annealing of sputtered Ti, Ti/TiN and TiNx thin films

Z. Krivokapic, M. Godec, A. Zalar, 1990 .

Determination of sputtering yields by a new procedure for depth profiling of multilayered structures

J. Fine, P. Panjan, B. Navinšek, 1984 .

Multiple-point depth profiling of multilayer Cr/Ni thin film structures on a rough substrate using scanning Auger microscopy

A. Zalar, S. Hofmann, A. Žabkar, 1985 .

Determination of the interface width of thin multilayered structures using quartz oscillator microbalance depth profiling

P. Panjan, B. Navinšek, A. Žabkar, 1985 .

Optical properties of nitride coatings deposited at low substrate temperatures

A. Demšar, P. Panjan, B. Navinšek, 1990 .

Comparative erosion yields, topographical changes and depth profile analysis of ion eroded nickel-based alloys

P. Panjan, B. Navinšek, M. Peternel, 1982 .