Masayuki Furumiya

发表

A 30 frames/s 2/3-in 1.3 M-pixel progressive scan IT-CCD image sensor

H. Utsumi, Nobukazu Teranishi, Satoshi Katoh, 2001 .

New technologies of photosensitivity improvement and VOD shutter voltage reduction for CCD image sensors

H. Utsumi, Nobukazu Teranishi, Keisuke Hatano, 1999, Electronic Imaging.

A 2.5kV isolation 35kV/us CMR 250Mbps 0.13mA/Mbps digital isolator in standard CMOS with an on-chip small transformer

Masayuki Mizuno, Mitsuji Okada, Masayuki Furumiya, 2010, 2010 Symposium on VLSI Circuits.

On-chip vertically coiled solenoid inductors and transformers for RF SoC using 90nm CMOS interconnect technology

Masayuki Furumiya, Hiroaki Namba, Takasuke Hashimoto, 2011, 2011 IEEE Radio Frequency Integrated Circuits Symposium.

A 1/2-in 1.3 M-pixel progressive-scan IT-CCD for digital still camera applications

H. Utsumi, Nobukazu Teranishi, A. Tanabe, 2001 .

A 2.5 kV Isolation 35 kV/us CMR 250 Mbps Digital Isolator in Standard CMOS With a Small Transformer Driving Technique

Tadashi Maeda, Masayuki Mizuno, Mitsuji Okada, 2012, IEEE Journal of Solid-State Circuits.

High sensitivity and no-cross-talk pixel technology for embedded CMOS image sensor

Hiroaki Ohkubo, Yasutaka Nakashiba, Masayuki Furumiya, 2000 .

A 1/3-in 1.3 M-pixel single-layer electrode CCD with a high-frame-rate skip mode

Keisuke Hatano, Yasutaka Nakashiba, Masayuki Furumiya, 2001 .

Optical limitations to cell size reduction in IT-CCD image sensors

Nobukazu Teranishi, S. Kawai, Keisuke Hatano, 1996 .

A 1/4 inch 380 k pixel IT-CCD image sensor employing gate-assisted punchthrough read-out mode

Nobukazu Teranishi, S. Kawai, Keisuke Hatano, 1993 .

Optical limitations to cell size reduction in IT-CCD image sensors

Nobukazu Teranishi, S. Kawai, Keisuke Hatano, 1995, Proceedings of International Electron Devices Meeting.