J. Park

Single and Multiple‐Step Dip‐Coating of Colloidal Maghemite (γ‐Fe2O3) Nanoparticles onto Si, Si3N4, and SiO2 Substrates

J. Oh, S. Min, T. Yoon, 2004 .

Measurement of the electrical properties of a polycrystalline cadmium telluride for direct conversion flat panel x-ray detector

J. S. Kim, S. Nam, S. Heo, 2014 .