P. Hurat

Methodology to extract, data mine and score geometric constructs from physical design layouts for analysis and applications in semiconductor manufacturing

Frank E. Gennari, Jason Sweis, Ya-Chieh Lai, 2016, SPIE Advanced Lithography.

Automated full-chip hotspot detection and removal flow for interconnect layers of cell-based designs

Philippe Hurat, Ed Roseboom, Mark Rossman, 2007, SPIE Advanced Lithography.