J. M. Zuo

Electron detection characteristics of a slow‐scan CCD camera, imaging plates and film, and electron image restoration

J M Zuo, J. M. Zuo, J. Zuo, 2000, Microscopy research and technique.

Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction

J. M. Zuo, J. Zuo, 1999, Microscopy research and technique.

Application of the Convergent Beam Imaging (CBIM) Technique to the Analysis of Crystal Defects

J. Spence, P. Cordier, J. Morniroli, 1997 .