S.P. Neo

Failure Analysis of A Unique Poly Defect

C.K. Oh, S.P. Neo, Z.G. Song, 2006, 2006 IEEE International Conference on Semiconductor Electronics.

Diagnosis and failure analysis for scan failure

C.K. Oh, S.P. Neo, Z.G. Song, 2005, Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..

Application of Focus Ion Beam Circuit Edit in Failure Analysis

C.K. Oh, S.P. Neo, Z.G. Song, 2006, 2006 IEEE International Conference on Semiconductor Electronics.

Application of FIB circuit edit combined with TIVA in advanced failure analysis

S.P. Neo, S. P. Neo, D. Zhu, 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.