M. Hayashi

Growth Mechanism During Firing Process of Single-Coated Thick YBCO Films by TFA-MOD

T. Araki, M. Hayashi, H. Fuke, 2013, IEEE Transactions on Applied Superconductivity.

Crystal Orientation Control of Bismuth Layer-Structured Dielectric Films Using Interface Layers of Perovskite-Type Oxides

H. Funakubo, Yoshitaka Ehara, H. Uchida, 2011 .

Atom-replaced pins in a Y-based superconductor—single-crystalline perovskite structure including both PrBa2Cu3O7−x and YBa2Cu3O7−y

G. Nishijima, A. Matsumoto, Hirotaka Ishii, 2018 .

Pole-tip design of high density recording thin film heads

H. Aoi, M. Saitoh, M. Ohura, 1982 .

Clustered atom-replaced structure in single-crystal-like metal oxide

G. Nishijima, Ryuji Yoshida, A. Matsumoto, 2018 .

Accurate evaluation of fast threshold voltage shift for SiC MOS devices under various gate bias stress conditions

Hiroshi Yano, Shinsuke Harada, Hajime Okumura, 2017 .

Hole trapping in SiC-MOS devices evaluated by fast-capacitance–voltage method

H. Yano, T. Hatakeyama, M. Sometani, 2018 .

Required Crack-Preventing Chemicals and Chemical Background for Single-Coated Technology to YBCO Thick Films by TFA-MOD

T. Araki, Nao Kobayashi, M. Hayashi, 2015, IEEE Transactions on Applied Superconductivity.