Yizi Xing

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example

Camelia Hora, Bratislav Tasic, Bram Kruseman, 2011, 2011 Design, Automation & Test in Europe.

Defect Oriented Testing for analog/mixed-signal devices

Camelia Hora, Bratislav Tasic, Bram Kruseman, 2011, 2011 IEEE International Test Conference.

Diagnosis of Local Spot Defects in Analog Circuits

Camelia Hora, Salvador Mir, Ke Huang, 2012, IEEE Transactions on Instrumentation and Measurement.

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices

Said Hamdioui, Bram Kruseman, Hamidreza Hashempour, 2011, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs

Yizi Xing, Liquan Fang, Mohammed Lemnawar, 2006, 2006 IEEE International Test Conference.

Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs

Yizi Xing, Liquan Fang, 2010, 2010 19th IEEE Asian Test Symposium.

Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC

Yang Zhong, Yizi Xing, Liquan Fang, 2007, 16th Asian Test Symposium (ATS 2007).

Defect Oriented Testing for Analog/Mixed-Signal Designs

Camelia Hora, Bratislav Tasic, Bram Kruseman, 2012, IEEE Design & Test of Computers.

The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits

Hans G. Kerkhoff, Vincent Kerzerho, Yizi Xing, 2011, 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop.

ASchematic-BasedExtractionMethodologyforDislocationDefectsin Analog/Mixed-SignalDevices

Said Hamdioui, Hamidreza Hashempour, B. Kruseman, 2011 .