W. Tittes

Reduction of some selected spectral interferences in inductively coupled plasma mass spectrometry

N. Jakubowski, J. Broekaert, G. Tölg, 1994 .

Performance characteristics of inductively coupled plasma mass spectrometry with high mass resolution

N. Jakubowski, I. Feldmann, U. Giessmann, 1994 .

Stress-induced anisotropy and domain patterns of amorphous Co67Fe4Mo1Si12B16

H. Kronmüller, T. Reininger, A. D. Santos, 1992 .

The influence of an applied tensile stress on the magnetic after-effect of Co67Fe4Mo1Si12B16

H. Kronmüller, A. D. Santos, N. Moser, 1993 .

Comparative analysis of aluminium oxide powders by inductively coupled plasma mass spectrometry with low and high mass resolution

N. Jakubowski, D. Pollmann, J. Broekaert, 1996 .

In-line failure analysis on productive wafers with dual-beam SEM/FIB systems

Christian Boit, Lothar Frey, Stefan Geyer, 2001, Microelectronic and MEMS Technologies.