T. Lundquist

Improving yield learning by rapid electrical fault inspection and localization

Beomjun Kim, I. Kapilevich, Jongtaek Hong, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Improving yield learning by electrical fault inspection

T. Lundquist, J. A. Block, P. Sakamoto, 2012, 2012 SEMI Advanced Semiconductor Manufacturing Conference.

Enhanced package- and die-level defect localization by dynamic lock-in thermography

T. Lundquist, Antoine Reverdy, R. Schlangen, 2011, 2011 17th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).