J. L. S. Lee

发表

Quantification and methodology issues in multivariate analysis of ToF‐SIMS data for mixed organic systems

Ian S. Gilmore, J. L. S. Lee, Martin P. Seah, 2008 .

Multivariate image analysis strategies for ToF‐SIMS images with topography

Ian S. Gilmore, J. L. S. Lee, Martin P. Seah, 2009 .

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.

J. L. S. Lee, R. Havelund, J. S. Sharp, 2013, Analytical chemistry.

Static SIMS–VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification

J. L. S. Lee, M. Seah, F. Green, 2010 .

Sputtering Yields of Gold Nanoparticles by C60 Ions

J. L. S. Lee, M. Seah, I. Gilmore, 2012 .

Linearity of the instrumental intensity scale in TOF‐SIMS—a VAMAS interlaboratory study

J. L. S. Lee, M. Seah, I. Gilmore, 2012 .

Artifacts in the sputtering of inorganics by C60n

J. L. S. Lee, M. Seah, I. Gilmore, 2008 .

VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report

J. L. S. Lee, S. Ray, I. Gilmore, 2011 .

Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.

J. L. S. Lee, M. Seah, A. Shard, 2010, Analytical chemistry.

Topography and field effects in secondary ion mass spectrometry Part II: insulating samples

J. L. S. Lee, M. Seah, A. Shard, 2012 .

Predicting the wettability of patterned ITO surface using ToF‐SIMS images

J. L. S. Lee, S. Ray, A. Shard, 2010 .

Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS

J. L. S. Lee, M. Seah, I. Gilmore, 2008 .