J. Y. Lee

Full-field wafer warpage measurement technique

Hung-Lin Hsieh, J. Y. Lee, Y. G. Huang, 2017, Optical Metrology.

Optimizing n-ZnO/p-Si heterojunctions for photodiode applications

J. Y. Lee, M. Park, Seongil Im, 2002 .

Field emission characteristics of a single free standing carbon nanotube with gate electrode

Ching Hsiang Tsai, Keh-Chyang Leou, Chuen-Horng Tsai, 2005 .

Electromigration comparison of selective CVD cobalt capping with PVD Ta(N) and CVD cobalt liners on 22nm-groundrule dual-damascene Cu interconnects

J. Y. Lee, F. H. Baumann, A. H. Simon, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).