Mukesh Puri

Testing SRAM-Based Content Addressable Memories

Fabrizio Lombardi, Jun Zhao, V. Swamy Irrinki, 2000, IEEE Trans. Computers.

Detection of inter-port faults in multi-port static RAMs

Fabrizio Lombardi, Jun Zhao, V. Swamy Irrinki, 2000, Proceedings 18th IEEE VLSI Test Symposium.

Optimizing memory tests by analyzing defect coverage

Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri, 2000, Records of the IEEE International Workshop on Memory Technology, Design and Testing.