T. Makino

Soft-Error Rate in a Logic LSI Estimated From SET Pulse-Width Measurements

T. Makino, D. Kobayashi, K. Hirose, 2009, IEEE Transactions on Nuclear Science.

Experimental Verification of Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems

Y. Yanagawa, H. Ikeda, H. Saito, 2009, IEEE Transactions on Nuclear Science.