Viktor Gonda
发表
Cong Huang,
Lis K. Nanver,
Koen Buisman,
2009,
IEEE Journal of Solid-State Circuits.
Willem D. van Driel,
G. Q. Zhang,
Jaap M. J. den Toonder,
2004,
Microelectron. Reliab..
G. Q. Zhang,
Kaspar M. B. Jansen,
Jaap M. J. den Toonder,
2007,
Microelectron. Reliab..
Sensitivity of the structural behavior of SAC305 interconnects on the variations of creep parameters
Viktor Gonda,
Ramiro Sebastian Vargas Cruz,
2021,
2021 IEEE 15th International Symposium on Applied Computational Intelligence and Informatics (SACI).