P. Girard

发表

L. Dilillo, A. Bosio, A. Todri, 2013, 2013 IEEE 31st VLSI Test Symposium (VTS).

C. Landrault, S. Pravossoudovitch, P. Girard, 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.

C. Landrault, S. Pravossoudovitch, P. Girard, 2007, 2007 IEEE International Test Conference.