H. E. Rhaleb

ANALYSIS OF BULK SAMPLE PHOTOTHERMAL RESPONSE BY TIME RESOLVED ELLIPSOMETRY

J. Roger, H. E. Rhaleb, 1994 .

Ex-situ spectroscopic ellipsometry studies of micron thick CVD diamond films

D. Fournier, J. Roger, A. Gicquel, 1996 .

Spectroscopic ellipsometry studies of index profile of indium tin oxide films prepared by spray pyrolysis

A. Ennaoui, J. Roger, A. Hakam, 2002 .

Spectroscopic ellipsometry characterization of ZnO–In2O3 systems

A. Hakam, A. E. Naciri, M. Addou, 2004 .

Spectroscopic ellipsometry under external excitation

A. Boccara, J. Roger, J. Stehle, 1993 .

Optical and thermal characterization of coatings

A. Boccara, D. Fournier, J. Roger, 1995 .