Xiangdong Xuan

Analysis and design of reliable mixed-signal CMOS circuits

Xiangdong Xuan, Xiangdong Xuan, 2004 .

Sensitivity and reliability evaluation for mixed-signal ICs under electromigration and hot-carrier effects

Abhijit Chatterjee, Xiangdong Xuan, A. Chatterjee, 2001, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.