M. Dion

EXTRA-EM: extraction of temperature and resistance for acceleration of electromigration at wafer-level

M. Dion, 1991, 29th Annual Proceedings Reliability Physics 1991.

Improved understanding of metal ion reservoirs within barrier-metal systems

Michael J. Dion, M. Dion, 2001, Microelectron. Reliab..

Proposal for a new integrated circuit and electronics neutron experiment source at oak ridge national laboratory

Eugene Normand, Laura Dominik, Michael J. Dion, 2009, 2009 IEEE International Reliability Physics Symposium.

On the status of wafer-level metal integrity testing

Michael J. Dion, M. Dion, 1993 .

Incorporation of Atmospheric Neutron Single Event Effects Analysis into a System Safety Assessment

Laura Dominik, Mike Dion, M. Dion, 2011 .

NSEU impact on commercial avionics

David C. Matthews, Michael J. Dion, M. Dion, 2009, 2009 IEEE International Reliability Physics Symposium.