J. P. Fradin

发表

J. P. Fradin, B. Desaunettes, L. Molla, 1997, Proceedings European Design and Test Conference. ED & TC 97.

Etienne Perret, David Dubuc, Patrick Pons, 2003, 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676).