Masashi Shimanouchi

An approach to consistent jitter modeling for various jitter aspects and measurement methods

Masashi Shimanouchi, Masashi Shimanouchi, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

New modeling methods for bounded Gaussian jitter (BGJ)/noise (BGN) and their applications in jitter/noise estimation/testing

Masashi Shimanouchi, Mike P. Li, Daniel Chow, 2009, 2009 International Test Conference.

Worst-Case Patterns for High- Speed Simulation and Measurement

Daniel Chow, Masashi Shimanouchi, Mike Peng Li, 2011 .

Periodic Jitter Injection with Direct Time Synthesis by SPPTM ATE for SerDes Jitter Tolerance Test in Production

Masashi Shimanouchi, 2003, ITC.

Tester architecture for the source synchronous bus

Masashi Shimanouchi, Robert Jackson, A. T. Sivaram, 2004, 2004 International Conferce on Test.

A Low-Cost Comparator-Based Method for Accurate Decomposition of Deterministic Jitter in High-Speed Links

Masashi Shimanouchi, Degang Chen, Mike P. Li, 2019, IEEE Transactions on Electromagnetic Compatibility.

Effective Link Equalizations for Serial Links at 112 Gbps and Beyond

Masashi Shimanouchi, Hsinho Wu, Mike PengLi, 2018, 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).

Theory, model, and applications of non-Gaussian probability density functions for random jitter/noise with non-white power spectral densities

Masashi Shimanouchi, Mike P. Li, Daniel Chow, 2013, 2013 IEEE International Test Conference (ITC).

Timing accuracy enhancement by a new calibration scheme for multi-Gbps ATE

Masashi Shimanouchi, 2004, 2004 International Conferce on Test.

New paradigm for signal paths in ATE pin electronics are needed for serialcom device testing

Masashi Shimanouchi, 2002, Proceedings. International Test Conference.

Advancements in high-speed link modeling and simulation (An invited paper for CICC 2013)

Masashi Shimanouchi, Mike P. Li, Hsinho Wu, 2013, Proceedings of the IEEE 2013 Custom Integrated Circuits Conference.

SERDES external loopback test using production parametric-test hardware

Masashi Shimanouchi, Sounil Biswas, Shalini Arora, 2016, 2016 IEEE International Test Conference (ITC).