Michael Mateja
发表
Jing Wang,
Jing Zeng,
Wu-Tung Cheng,
2012,
IEEE Design & Test of Computers.
Grady Giles,
Alfred L. Crouch,
Michael Mateja,
1997,
Proceedings International Test Conference 1997.
Jeff Rearick,
Jing Zeng,
Li-C. Wang,
2010,
Proceedings of 2010 International Symposium on VLSI Design, Automation and Test.
Jeff Rearick,
Jing Zeng,
Li-C. Wang,
2010,
2010 28th VLSI Test Symposium (VTS).
Jing Zeng,
Li-C. Wang,
Michael Mateja,
2010,
2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC).
Grady Giles,
Alfred L. Crouch,
Michael Mateja,
1998,
IEEE Des. Test Comput..
Grady Giles,
Tim Wood,
Daniela Toneva,
2008,
2008 IEEE International Test Conference.
Jing Wang,
Jing Zeng,
Li-C. Wang,
2010,
2010 11th International Symposium on Quality Electronic Design (ISQED).
Dat Tran,
Alfred L. Crouch,
John C. Potter,
2000,
IEEE Des. Test Comput..
Jing Wang,
Jing Zeng,
Michael Mateja,
2009,
2009 10th International Workshop on Microprocessor Test and Verification.
Jing Zeng,
Li-C. Wang,
Po-Hsien Chang,
2009,
2009 International Test Conference.
Dat Tran,
Alfred L. Crouch,
John C. Potter,
1999,
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Jing Zeng,
Li-C. Wang,
Dragoljub Gagi Drmanac,
2010,
2010 IEEE International Test Conference.